Atomic scale study of Si-doped AlAs by cross-sectional scanning tunneling microscopy and density functional theory

D. Tjeertes (Corresponding author), A. Vela, T.J.F. Verstijnen, E.G. Banfi, P.J. van Veldhoven, M.G. Menezes, Universidade Federal do de Janeiro, B. Koiller, P.M. Koenraad

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