Abstract
A review of recent developments in the field of passivation of c-Si surfaces is presented, with a particular focus on materials that can be prepared by atomic layer deposition (ALD). Besides Al2O3, various other novel passivation schemes have recently been developed, such as Ga2O3, Ta2O5, SiO2/Al2O3, HfO2/Al2O3 and TiO2, which altogether can passivate a wider variety of doped and textured Si surfaces. Moreover, they are interesting candidates in the emerging field of passivating contacts, for instance as novel tunnel oxides. In this field, ALD can offer some distinct advantages, such as a precise control in film thickness, composition and even area-selective deposition.
Original language | English |
---|---|
Title of host publication | 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1-6 |
Number of pages | 6 |
ISBN (Electronic) | 978-1-5090-5605-7 |
ISBN (Print) | 978-1-5090-5606-4 |
DOIs | |
Publication status | Published - 25 May 2018 |
Event | 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States Duration: 25 Jun 2017 → 30 Jun 2017 Conference number: 44 |
Conference
Conference | 44th IEEE Photovoltaic Specialist Conference, PVSC 2017 |
---|---|
Abbreviated title | PVSC 2017 |
Country/Territory | United States |
City | Washington |
Period | 25/06/17 → 30/06/17 |
Keywords
- Charge carrier lifetime
- Contacts
- Crystalline silicon
- Photovoltaic cells
- Surface passivation