Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy

P.L.J. Gunter; J.W. Niemantsverdriet

Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy

P.L.J. Gunter, J.W. Niemantsverdriet

Inorganic Materials & Catalysis

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]
Editors	H.-J. Güntherodt, D. Anselmitti, E. Meyer
Place of Publication	Dordrecht
Publisher	Kluwer Academic Publishers
Pages	495-
ISBN (Print)	0-7923-3406-X
Publication status	Published - 1994
Event	conference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18 - Duration: 7 Mar 1994 → 18 Mar 1994

Publication series

Name	NATO ASI Series, Series E: Applied Sciences
Volume	286
ISSN (Print)	0168-132X

Conference

Conference	conference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18
Period	7/03/94 → 18/03/94
Other	NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18

Cite this

Gunter, P. L. J., & Niemantsverdriet, J. W. (1994). Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy. In H-J. Güntherodt, D. Anselmitti, & E. Meyer (Eds.), Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994] (pp. 495-). (NATO ASI Series, Series E: Applied Sciences; Vol. 286). Kluwer Academic Publishers.

Gunter, P.L.J. ; Niemantsverdriet, J.W. / Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy. Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]. editor / H.-J. Güntherodt ; D. Anselmitti ; E. Meyer. Dordrecht : Kluwer Academic Publishers, 1994. pp. 495- (NATO ASI Series, Series E: Applied Sciences).

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author = "P.L.J. Gunter and J.W. Niemantsverdriet",

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series = "NATO ASI Series, Series E: Applied Sciences",

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booktitle = "Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]",

address = "Netherlands",

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Gunter, PLJ & Niemantsverdriet, JW 1994, Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy. in H-J Güntherodt, D Anselmitti & E Meyer (eds), Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]. NATO ASI Series, Series E: Applied Sciences, vol. 286, Kluwer Academic Publishers, Dordrecht, pp. 495-, conference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18, 7/03/94.

Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy. / Gunter, P.L.J.; Niemantsverdriet, J.W.

Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]. ed. / H.-J. Güntherodt; D. Anselmitti; E. Meyer. Dordrecht : Kluwer Academic Publishers, 1994. p. 495- (NATO ASI Series, Series E: Applied Sciences; Vol. 286).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy

AU - Gunter, P.L.J.

AU - Niemantsverdriet, J.W.

PY - 1994

Y1 - 1994

M3 - Conference contribution

SN - 0-7923-3406-X

T3 - NATO ASI Series, Series E: Applied Sciences

SP - 495-

BT - Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]

A2 - Güntherodt, H.-J.

A2 - Anselmitti, D.

A2 - Meyer, E.

PB - Kluwer Academic Publishers

CY - Dordrecht

T2 - conference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18

Y2 - 7 March 1994 through 18 March 1994

ER -

Gunter PLJ, Niemantsverdriet JW. Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy. In Güntherodt H-J, Anselmitti D, Meyer E, editors, Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]. Dordrecht: Kluwer Academic Publishers. 1994. p. 495-. (NATO ASI Series, Series E: Applied Sciences).