@inproceedings{e15120aa2ffb4f62a792d17b471a1293,
title = "Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy",
author = "P.L.J. Gunter and J.W. Niemantsverdriet",
year = "1994",
language = "English",
isbn = "0-7923-3406-X",
series = "NATO ASI Series, Series E: Applied Sciences",
publisher = "Kluwer Academic Publishers",
pages = "495--",
editor = "H.-J. G{\"u}ntherodt and D. Anselmitti and E. Meyer",
booktitle = "Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]",
address = "Netherlands",
note = "conference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18 ; Conference date: 07-03-1994 Through 18-03-1994",
}