Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy

P.L.J. Gunter, J.W. Niemantsverdriet

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationForces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994]
EditorsH.-J. Güntherodt, D. Anselmitti, E. Meyer
Place of PublicationDordrecht
PublisherKluwer Academic Publishers
Pages495-
ISBN (Print)0-7923-3406-X
Publication statusPublished - 1994
Eventconference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18 -
Duration: 7 Mar 199418 Mar 1994

Publication series

NameNATO ASI Series, Series E: Applied Sciences
Volume286
ISSN (Print)0168-132X

Conference

Conferenceconference; NATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18; 1994-03-07; 1994-03-18
Period7/03/9418/03/94
OtherNATO Advanced Study Institute on Forces in Scanning Probe Methods ; (Schluchsee) : 1994.03.07-18

Cite this

Gunter, P. L. J., & Niemantsverdriet, J. W. (1994). Atomic force microscopy as a tool to study surface roughness effects in X-ray photoelectron microscopy. In H-J. Güntherodt, D. Anselmitti, & E. Meyer (Eds.), Forces in scanning probe methods : [proceedings of the NATO Advanced Study Institute on Forces in Scanning Probe Methods, Schluchsee, Germany, March 7-18, 1994] (pp. 495-). (NATO ASI Series, Series E: Applied Sciences; Vol. 286). Dordrecht: Kluwer Academic Publishers.