Atmospheric-pressure silica-like thin film deposition using 200 kHz/13.56 MHz dual frequency excitation

  • Y. Liu
  • , F.M. Elam
  • , E. Zoethout
  • , S.A. Starostin
  • , M.C.M. van de Sanden
  • , H.W. de Vries (Corresponding author)

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)
112 Downloads (Pure)

Abstract

Atmospheric pressure plasma enhanced chemical vapour deposition was used to synthesize silica-like thin films on polyethylene 2, 6 naphthalate substrate with hexamethyldisiloxane as the precursor and Ar/O2/N2 mixture as the working gas. A dual frequency (DF) excitation consisting of 200 kHz and 13.56 MHz frequencies was employed as the plasma source. The results have shown that compared to the single low frequency discharges, the DF excitation helps to improve plasma uniformity with less filaments. This could help to reduce the macro-defects and therefore to improve the permeation performance of the barriers. Besides, due to the increased electron density and gas temperature, the DF excitation demonstrates a more efficient breaking of Si-CH3 bonds and therefore more oxidized structures of the deposited silica-like thin films.

Original languageEnglish
Article number355201
Number of pages11
JournalJournal of Physics D: Applied Physics
Volume52
Issue number35
DOIs
Publication statusPublished - 2 Jul 2019

Keywords

  • AP-PECVD
  • dual frequency
  • microstructure
  • silica-like thin film
  • surface morphology

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