Assessment of vulnerable plaque composition by matching the deformation of a parametric plaque model to measured plaque deformation

R.A. Baldewsing, J.A. Schaar, F. Mastik, C.W.J. Oomens, A.F.W. Steen, van der

Research output: Contribution to journalArticleAcademicpeer-review

55 Citations (Scopus)
Original languageEnglish
Pages (from-to)514-528
JournalIEEE Transactions on Medical Imaging
Issue number4
Publication statusPublished - 2005

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