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Assessing the performance of two-dimensional dopant profiling techniques

  • N. Duhayon
  • , P. Eyben
  • , M. Fouchier
  • , T. Clarysse
  • , W. Vandervorst
  • , D. Álvarez
  • , S. Schoemann
  • , M. Ciappa
  • , M. Stangoni
  • , W. Fichtner
  • , P. Formanek
  • , M. Kittler
  • , V. Raineri
  • , F. Giannazzo
  • , D. Goghero
  • , Y. Rosenwaks
  • , R. Shikler
  • , S. Saraf
  • , S. Sadewasser
  • , N. Barreau
  • T. Glatzel, M. Verheijen, S.A.M. Mentink, M. von Sprekelsen, T. Maltezopoulos, R. Wiesendanger, L. Hellemans

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

The performance of two-dimensional dopant profiling techniques was studied. This study was carried out within the framework of a European project (HERCULAS), which is focused on the improvement of 2D-profiling tools. The practical organization of the round robin and the different samples that were exchanged was discussed. The results show that all the techniques succeeded in measuring the p- and n-type calibration samples.

Original languageEnglish
Pages (from-to)385-393
Number of pages9
JournalJournal of Vacuum Science and Technology B
Volume22
Issue number1
DOIs
Publication statusPublished - 1 Jan 2004
Externally publishedYes

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