Abstract
Motivated by the yield optimization problem in semiconductor manufacturing, we model the wafer to wafer integration problem as a special multi-dimensional assignment problem (called WWI-m), and study it from an approximation point of view. We give approximation algorithms achieving an approximation factor of 3/2 and 4/3 for WWI-3, and we show that extensions of these algorithms to the case of arbitrary m do not give constant factor approximations. We argue that a special case of the yield optimization problem can be solved in polynomial time.
| Original language | English |
|---|---|
| Title of host publication | Approximation and Online Algorithms : 10th International Workshop, WAOA 2012, Revised Selected Papers |
| Editors | Thomas Erlebach, Giuseppe Persiano |
| Place of Publication | Berlin |
| Publisher | Springer |
| Pages | 286-297 |
| Number of pages | 12 |
| ISBN (Electronic) | 978-3-642-38016-7 |
| ISBN (Print) | 978-3-642-38015-0 |
| DOIs | |
| Publication status | Published - 2013 |
| Externally published | Yes |
| Event | 10th International Workshop on Approximation and Online Algorithms (WAOA 2012) - Ljubljana, Slovenia Duration: 13 Sept 2012 → 14 Sept 2012 Conference number: 10 |
Publication series
| Name | Lecture Notes in Computer Science |
|---|---|
| Volume | 7846 |
| ISSN (Print) | 0302-9743 |
| ISSN (Electronic) | 1611-3349 |
Conference
| Conference | 10th International Workshop on Approximation and Online Algorithms (WAOA 2012) |
|---|---|
| Abbreviated title | WOA 2012 |
| Country/Territory | Slovenia |
| City | Ljubljana |
| Period | 13/09/12 → 14/09/12 |
Keywords
- Approximation
- Computational complexity
- Efficient algorithm
- Wafer-to-wafer integration
Fingerprint
Dive into the research topics of 'Approximation algorithms for the wafer to wafer integration problem'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver