Abstract
With conventional semiconductor fabrication based on top-down processing reaching its limits in terms of patterning resolution and alignment, there is increasing interest in the implementation of bottom-up fabrication steps. In this contribution, several approaches for bottom-up processing by area-selective atomic layer deposition (ALD) will be reviewed, and the application possibilities and the main challenges in the field will be discussed.
Original language | English |
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Title of host publication | 2018 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2018 |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Number of pages | 2 |
ISBN (Electronic) | 9781538648254 |
DOIs | |
Publication status | Published - 3 Jul 2018 |
Event | 2018 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2018 - Hsinchu, Taiwan Duration: 16 Apr 2018 → 19 Apr 2018 |
Conference
Conference | 2018 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2018 |
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Country/Territory | Taiwan |
City | Hsinchu |
Period | 16/04/18 → 19/04/18 |