@inbook{aca84a115de74488b50b5c7e93dd0687,
title = "Applications of secondary ion mass spectrometry in catalysis and surface chemistry",
abstract = "A review with 182 refs. is given on phys. phenomena such as sputtering, ion emission, ionization and neutralization which are involved in SIMS. Applications of SIMS in catalysis and obtaining information about catalysts interactions with gases promoters and poisons are described. Also applications of SIMS in surface reactivity studies, adsorption and surface reactions are discussed. [on SciFinder (R)]",
author = "H.J. Borg and J.W. Niemantsverdriet",
year = "1994",
doi = "10.1039/9781847553232-00051",
language = "English",
isbn = "0-85186-654-9",
series = "Catalysis : a review of the literature",
publisher = "Royal Society of Chemistry",
pages = "1--50",
editor = "J.J. Spivey and S.K. Agarwal",
booktitle = "Catalysis, vol. 11",
address = "United Kingdom",
}