Applications of scanning tunneling microscopy to solid state physics

H. Kempen, van, E.J.G. Boon, M.C.M.M. Wielen, van der, J.W.G. Wilder, M.W.J. Prins, R. Jansen, R. Schad

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

Due to the dependence of the tunnel current to material properties like work function, density of states, and spin polarization the scanning tunneling microscope can be used to study a number of solid state physics problems. This will be illustrated with some examples. The presented examples have in common that also the role of the tip properties have to be taken explicitly into account
Original languageEnglish
Pages (from-to)323-331
JournalActa Physica Polonica A
Volume93
Issue number2
Publication statusPublished - 1998

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