Abstract
The authors have studied the diffraction pattern produced by a particle field illuminated by an elliptic and astigmatic Gaussian beam. They demonstrate that the bidimensional fractional Fourier transformation is a mathematically suitable tool to analyse the diffraction pattern generated not only by a collimated plane wave [J. Opt. Soc. Am A 19, 1537 (2002)], but also by an elliptic and astigmatic Gaussian beam when two different fractional orders are considered. Simulations and experimental results are presented.
Original language | English |
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Pages (from-to) | 2569-2577 |
Number of pages | 9 |
Journal | Journal of the Optical Society of America A, Optics, Image Science and Vision |
Volume | 22 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2005 |