Anti-reflection subwavelength gratings for InP-based waveguide facets

Lukas Puts (Corresponding author), Xaveer J.M. Leijtens, Pavel Cheben, Jens Schmid, Sander Reniers, Daniele Melati

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Abstract

We demonstrate the anti-reflection properties of lithographically defined subwavelength gratings applied to the facets of integrated waveguides realized in the InP membrane-on-silicon platform. The subwavelength gratings are based on the gradient index effect to create a smooth index transition between the core material and air, making it possible to obtain reflections below −30 dB at a wavelength of 1550 nm for both TE and TM polarized modes, as shown by 3D finite-difference time-domain simulations. Characterizations performed using Mach–Zehnder interferometers as test structures show relative reflections as low as −25 dB, confirming the effectiveness of the technique.
Original languageEnglish
Pages (from-to)3701-3704
Number of pages4
JournalOptics Letters
Volume46
Issue number15
DOIs
Publication statusPublished - 1 Aug 2021

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