Anti-reflection subwavelength gratings for InP-based waveguide facets

Lukas Puts; Xaveer J.M. Leijtens; Pavel Cheben; Jens Schmid; Sander Reniers; Daniele Melati

doi:10.1364/OL.431353

Anti-reflection subwavelength gratings for InP-based waveguide facets

Lukas Puts (Corresponding author), Xaveer J.M. Leijtens, Pavel Cheben, Jens Schmid, Sander Reniers, Daniele Melati

Photonic Integration

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Abstract

We demonstrate the anti-reflection properties of lithographically defined subwavelength gratings applied to the facets of integrated waveguides realized in the InP membrane-on-silicon platform. The subwavelength gratings are based on the gradient index effect to create a smooth index transition between the core material and air, making it possible to obtain reflections below −30 dB at a wavelength of 1550 nm for both TE and TM polarized modes, as shown by 3D finite-difference time-domain simulations. Characterizations performed using Mach–Zehnder interferometers as test structures show relative reflections as low as −25 dB, confirming the effectiveness of the technique.

Original language	English
Pages (from-to)	3701-3704
Number of pages	4
Journal	Optics Letters
Volume	46
Issue number	15
DOIs	https://doi.org/10.1364/OL.431353
Publication status	Published - 1 Aug 2021

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10.1364/OL.431353

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title = "Anti-reflection subwavelength gratings for InP-based waveguide facets",

abstract = "We demonstrate the anti-reflection properties of lithographically defined subwavelength gratings applied to the facets of integrated waveguides realized in the InP membrane-on-silicon platform. The subwavelength gratings are based on the gradient index effect to create a smooth index transition between the core material and air, making it possible to obtain reflections below −30 dB at a wavelength of 1550 nm for both TE and TM polarized modes, as shown by 3D finite-difference time-domain simulations. Characterizations performed using Mach–Zehnder interferometers as test structures show relative reflections as low as −25 dB, confirming the effectiveness of the technique.",

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AU - Puts, Lukas

AU - Leijtens, Xaveer J.M.

AU - Cheben, Pavel

AU - Schmid, Jens

AU - Reniers, Sander

AU - Melati, Daniele

PY - 2021/8/1

Y1 - 2021/8/1

N2 - We demonstrate the anti-reflection properties of lithographically defined subwavelength gratings applied to the facets of integrated waveguides realized in the InP membrane-on-silicon platform. The subwavelength gratings are based on the gradient index effect to create a smooth index transition between the core material and air, making it possible to obtain reflections below −30 dB at a wavelength of 1550 nm for both TE and TM polarized modes, as shown by 3D finite-difference time-domain simulations. Characterizations performed using Mach–Zehnder interferometers as test structures show relative reflections as low as −25 dB, confirming the effectiveness of the technique.

AB - We demonstrate the anti-reflection properties of lithographically defined subwavelength gratings applied to the facets of integrated waveguides realized in the InP membrane-on-silicon platform. The subwavelength gratings are based on the gradient index effect to create a smooth index transition between the core material and air, making it possible to obtain reflections below −30 dB at a wavelength of 1550 nm for both TE and TM polarized modes, as shown by 3D finite-difference time-domain simulations. Characterizations performed using Mach–Zehnder interferometers as test structures show relative reflections as low as −25 dB, confirming the effectiveness of the technique.

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DO - 10.1364/OL.431353

M3 - Letter

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VL - 46

SP - 3701

EP - 3704

JO - Optics Letters

JF - Optics Letters

IS - 15

ER -

Anti-reflection subwavelength gratings for InP-based waveguide facets

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