Angle-resolved single-wavelength 1D inverse profiling with a CSI approach

Loes F. van Rijswijk, Thomai Zacharopoulou (Editor), Remco Dirks (Editor), Martijn C. van Beurden (Supervisor)

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Abstract

We study the behavior of the contrast source inversion method in case of a one-dimensional electromagnetic inverse profiling problem with angular data only. We analyze the update strategy via a local quadratic approximation, which
leads to a modification in the update strategy for the contrast source. With this modification, we obtain significant improved results when reconstructing with angular data. Additionally, we discuss conditions for the angles of incidence for which it is most likely to have a successful reconstruction.
Original languageEnglish
Title of host publication2019 International Conference on Electromagnetics in Advanced Applications (ICEAA)
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages952-957
Number of pages6
ISBN (Electronic)978-1-7281-0563-5
DOIs
Publication statusPublished - Sep 2019
Event21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019 - Granada, Spain
Duration: 9 Sep 201913 Sep 2019

Conference

Conference21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019
CountrySpain
CityGranada
Period9/09/1913/09/19

Keywords

  • contrast source inversion method
  • reconstruction
  • inverse profiling
  • angular data
  • Angular data
  • Reconstruction
  • Inverse profiling
  • Contrast source inversion method

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  • Cite this

    van Rijswijk, L. F., Zacharopoulou, T. (Ed.), Dirks, R. (Ed.), & van Beurden, M. C. (2019). Angle-resolved single-wavelength 1D inverse profiling with a CSI approach. In 2019 International Conference on Electromagnetics in Advanced Applications (ICEAA) (pp. 952-957). [8878926] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICEAA.2019.8878926