Analyzing fuzziness in product quality & reliability information-flow during time-driven product-development-processes

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Original language	English
Pages (from-to)	496-502
Journal	Proceedings: Annual Reliability and Maintainability Symposium
DOIs	https://doi.org/10.1109/RAMS.2002.981693
Publication status	Published - 2002

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@article{b46debb72f4d43d6affcb14ec66b8aa4,

title = "Analyzing fuzziness in product quality \& reliability information-flow during time-driven product-development-processes",

author = "Y. Lu and A.C. Brombacher and \{Ouden, den\}, P.H. and P.M.W. K{\"o}rvers",

year = "2002",

doi = "10.1109/RAMS.2002.981693",

language = "English",

pages = "496--502",

journal = "Proceedings: Annual Reliability and Maintainability Symposium",

issn = "0149-144X",

publisher = "Institute of Electrical and Electronics Engineers",

}

TY - JOUR

T1 - Analyzing fuzziness in product quality & reliability information-flow during time-driven product-development-processes

AU - Lu, Y.

AU - Brombacher, A.C.

AU - Ouden, den, P.H.

AU - Körvers, P.M.W.

PY - 2002

Y1 - 2002

U2 - 10.1109/RAMS.2002.981693

DO - 10.1109/RAMS.2002.981693

M3 - Article

SN - 0149-144X

SP - 496

EP - 502

JO - Proceedings: Annual Reliability and Maintainability Symposium

JF - Proceedings: Annual Reliability and Maintainability Symposium

ER -