Analysis of the test data volume reduction benefit of modular SOC testing

O. Sinanoglu, E.J. Marinissen

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

6 Citations (Scopus)
1 Downloads (Pure)

Abstract

Modular SOC testing offers numerous benefits that include test power reduction, ease of timing closure, and test re-use among many others. While all these benefits have been emphasized by researchers, the test time and data volume comparisons has been mostly constrained within the context of modular SOC testing only, by comparing the impact of various different modular SOC testing techniques to each other. In this paper, we provide a theoretical test data volume analysis that compares the monolithic test of a flattened design with the same design tested in a modular manner; we present numerous experiments that gauge the magnitude of this benefit. We show that the test data volume reduction delivered by modular SOC testing directly hinges on the test pattern count variation across different modules, and that this reduction can exceed 99% in the SOC benchmarks that we have experimented with.
Original languageEnglish
Title of host publication2008 Design, Automation and Test in Europe
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages182-187
Number of pages6
ISBN (Electronic)978-3-9810801-4-8
ISBN (Print)978-3-9810801-3-1
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event11th Design, Automation and Test in Europe Conference and Exhibition (DATE 2008 ) - Munich, Germany
Duration: 10 Mar 200814 Mar 2008
Conference number: 11

Conference

Conference11th Design, Automation and Test in Europe Conference and Exhibition (DATE 2008 )
Abbreviated titleDATE 2008
Country/TerritoryGermany
CityMunich
Period10/03/0814/03/08

Fingerprint

Dive into the research topics of 'Analysis of the test data volume reduction benefit of modular SOC testing'. Together they form a unique fingerprint.

Cite this