Analysis of the reflection characteristics of a planar EBG structure on lossy silicon substrates

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Abstract

Electromagnetic band gap (EBG) structures can exhibit high impedance surface (HIS) performance on a lossless substrate. However, the performance of an EBG structure is not only determined by the type of element or physical dimensions, but also by the electrical characteristics of the dielectric substrate. The evolution of an EBG structure from HIS to metamaterial absorber with different lossy silicon substrates is analyzed and presented in a reflection magnitude and phase graph. The conductivity of the used substrate is introduced to represent the loss tangent of the silicon substrate. An equivalent circuit model is developed that models the EBG on a lossy silicon substrate. The small differences between calculated and simulated results are explained by ignoring the patch series inductance Ls and the capacitance Ch between the patch and ground plane. Based on the analysis of the reflection characteristics on lossy silicon substrates, this planar EBG structure provides an acceptable performance in BiCMOS technologies, but cannot be used in low-Ohmic CMOS technologies.
Original languageEnglish
Title of host publication10th European Conference on Antennas and Propagation (EuCAP), 10-15 April 2016, Davos, Switzerland
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Number of pages4
ISBN (Print)978-88-907018-6-3
DOIs
Publication statusPublished - 2 Jun 2016
Event10th European Conference on Antennas and Propagation (EuCAP 2016) - Davos, Switzerland
Duration: 10 Apr 201615 Apr 2016
Conference number: 10
http://www.eucap.org/

Conference

Conference10th European Conference on Antennas and Propagation (EuCAP 2016)
Abbreviated titleEuCAP 2016
CountrySwitzerland
CityDavos
Period10/04/1615/04/16
Internet address

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  • Cite this

    Liu, Q., Xi, Y., Reniers, A., & Smolders, A. B. (2016). Analysis of the reflection characteristics of a planar EBG structure on lossy silicon substrates. In 10th European Conference on Antennas and Propagation (EuCAP), 10-15 April 2016, Davos, Switzerland [7481414] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EuCAP.2016.7481414