### Abstract

The phase locking index (PLI) was introduced to quantify in a statistical sense the phase synchronization of two signals. It has been commonly used to process biosignals. In this
paper, we analyze the PLI for measuring the interdependency of cortical source signals (CSSs) recorded in the Electroencephalogram (EEG). The main focus of the analysis is
the probability density function, which describes the sensitivity of the PLI to the joint noise ensemble in the CSSs. Since this function is mathematically intractable, we derive
approximations and analyze them for a simple analytical model of the CSS mixture in the EEG. The accuracies of the approximate probability density functions (APDFs) are
evaluated using simulations for the model. The APDFs are found sufficiently accurate and thus are applicable for practical intents and purposes. They can hence be used to
determine the confidence intervals and significance levels for detection methods for interdependencies, e.g., between cortical signals recorded in the EEG

Original language | English |
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Title of host publication | Proceedings of the 29th Annual International Conference of the IEEE-EMBS, 23-26 August 2007, Lyon, France |

Place of Publication | Lyon |

Publisher | Institute of Electrical and Electronics Engineers |

Pages | 1985-1991 |

Publication status | Published - 2007 |

Event | conference; The 29th Annual International Conference of the IEEE EMBS (EMBC); Lyon; FR; 2007-08-23; 2007-08-26 - Duration: 23 Aug 2007 → 26 Aug 2007 |

### Conference

Conference | conference; The 29th Annual International Conference of the IEEE EMBS (EMBC); Lyon; FR; 2007-08-23; 2007-08-26 |
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Period | 23/08/07 → 26/08/07 |

Other | The 29th Annual International Conference of the IEEE EMBS (EMBC); Lyon; FR |

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## Cite this

Sazonov, A., Ho, C. K., Bergmans, J. W. M., Arends, J. B. A. M., Griep, P. A. M., Verbitskiy, E. A., ... Boon, P. A. J. M. (2007). Analysis of the Phase Locking Index for Measuring of Interdependency of Cortical Signals Recorded in the EEG. In

*Proceedings of the 29th Annual International Conference of the IEEE-EMBS, 23-26 August 2007, Lyon, France*(pp. 1985-1991). Lyon: Institute of Electrical and Electronics Engineers.