Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

V. Favre-Nicolin; F. Mastropietro; J. Eymery; D. Camacho; Y.M. Niquet; B.M. Borg; M.E. Messing; L.-E. Wernersson; R.E. Algra; E.P.A.M. Bakkers; T.H. Metzger; R. Harder; I.K. Robinson

doi:10.1088/1367-2630/12/3/035013

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

V. Favre-Nicolin, F. Mastropietro, J. Eymery, D. Camacho, Y.M. Niquet, B.M. Borg, M.E. Messing, L.-E. Wernersson, R.E. Algra, E.P.A.M. Bakkers, T.H. Metzger, R. Harder, I.K. Robinson

Photonics and Semiconductor Nanophysics

Research output: Contribution to journal › Article › Academic › peer-review

58 Citations (Scopus)

91 Downloads (Pure)

Abstract

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013

Original language	English
Article number	035013
Pages (from-to)	035013-1/17
Number of pages	17
Journal	New Journal of Physics
Volume	12
Issue number	3
DOIs	https://doi.org/10.1088/1367-2630/12/3/035013
Publication status	Published - 2010

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Favre-Nicolin, V., Mastropietro, F., Eymery, J., Camacho, D., Niquet, Y. M., Borg, B. M., Messing, M. E., Wernersson, L-E., Algra, R. E., Bakkers, E. P. A. M., Metzger, T. H., Harder, R., & Robinson, I. K. (2010). Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging. New Journal of Physics, 12(3), 035013-1/17. [035013]. https://doi.org/10.1088/1367-2630/12/3/035013

Favre-Nicolin, V. ; Mastropietro, F. ; Eymery, J. ; Camacho, D. ; Niquet, Y.M. ; Borg, B.M. ; Messing, M.E. ; Wernersson, L.-E. ; Algra, R.E. ; Bakkers, E.P.A.M. ; Metzger, T.H. ; Harder, R. ; Robinson, I.K. / Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging. In: New Journal of Physics. 2010 ; Vol. 12, No. 3. pp. 035013-1/17.

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title = "Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging",

abstract = "Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. {\textcopyright} IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013",

author = "V. Favre-Nicolin and F. Mastropietro and J. Eymery and D. Camacho and Y.M. Niquet and B.M. Borg and M.E. Messing and L.-E. Wernersson and R.E. Algra and E.P.A.M. Bakkers and T.H. Metzger and R. Harder and I.K. Robinson",

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language = "English",

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Favre-Nicolin, V, Mastropietro, F, Eymery, J, Camacho, D, Niquet, YM, Borg, BM, Messing, ME, Wernersson, L-E, Algra, RE, Bakkers, EPAM, Metzger, TH, Harder, R & Robinson, IK 2010, 'Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging', New Journal of Physics, vol. 12, no. 3, 035013, pp. 035013-1/17. https://doi.org/10.1088/1367-2630/12/3/035013

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging. / Favre-Nicolin, V.; Mastropietro, F.; Eymery, J.; Camacho, D.; Niquet, Y.M.; Borg, B.M.; Messing, M.E.; Wernersson, L.-E.; Algra, R.E.; Bakkers, E.P.A.M.; Metzger, T.H.; Harder, R.; Robinson, I.K.

In: New Journal of Physics, Vol. 12, No. 3, 035013, 2010, p. 035013-1/17.

Research output: Contribution to journal › Article › Academic › peer-review

TY - JOUR

T1 - Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

AU - Favre-Nicolin, V.

AU - Mastropietro, F.

AU - Eymery, J.

AU - Camacho, D.

AU - Niquet, Y.M.

AU - Borg, B.M.

AU - Messing, M.E.

AU - Wernersson, L.-E.

AU - Algra, R.E.

AU - Bakkers, E.P.A.M.

AU - Metzger, T.H.

AU - Harder, R.

AU - Robinson, I.K.

PY - 2010

Y1 - 2010

N2 - Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013

AB - Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013

U2 - 10.1088/1367-2630/12/3/035013

DO - 10.1088/1367-2630/12/3/035013

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JO - New Journal of Physics

JF - New Journal of Physics

SN - 1367-2630

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M1 - 035013

ER -