Abstract
Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013
Original language | English |
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Article number | 035013 |
Pages (from-to) | 035013-1/17 |
Number of pages | 17 |
Journal | New Journal of Physics |
Volume | 12 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2010 |