Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

V. Favre-Nicolin, F. Mastropietro, J. Eymery, D. Camacho, Y.M. Niquet, B.M. Borg, M.E. Messing, L.-E. Wernersson, R.E. Algra, E.P.A.M. Bakkers, T.H. Metzger, R. Harder, I.K. Robinson

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58 Citations (Scopus)
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Abstract

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013
Original languageEnglish
Article number035013
Pages (from-to)035013-1/17
Number of pages17
JournalNew Journal of Physics
Volume12
Issue number3
DOIs
Publication statusPublished - 2010

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