Abstract
Resonances present in coupling phenomena between a randomly varying thin-wire transmission-line, and an electro-magnetic field are stochastically characterized. This is achieved by using the first 4 statistical moments in order to appreciate the intensity of the resonance phenomena. The stochastic method proposed is applied to a thin-wire transmission line connected to a variable impedance, and, undergoing random geometrically localized perturbations.
Original language | English |
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Title of host publication | 20th International Zurich Symposium on Electromagnetic Compatibility, 12-16 January 2009, Zurich, Switzerland |
Editors | R. Vahldieck |
Place of Publication | Piscataway |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 33-36 |
ISBN (Print) | 978-3-9523286-6-8 |
DOIs | |
Publication status | Published - 2009 |