Analysis of parasitic effects in PICs using circuit simulation

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Abstract

An understanding of parasitic effects is essential to maximize the performance of a Photonic Integrated Circuit (PIC). Using a circuit simulator, we are able to model mode conversion at the interface between straight and bent waveguides, parasitic reflections in multi-mode interference couplers (MMIs), interference between multiple modes, residual facet reflections, and reflections at junctions between components. Even though these effects are usually low in intensity, around -20 dB to -30 dB from the main signal level, they can still have a strong influence on the circuit performance. This is because the mentioned parasitic effects are coherent with the desired signal and interference between them is therefore a field effect. By analyzing three different circuits, and comparing the results to measurements, we show that these effects need to be carefully managed in order to ensure circuit performance. The circuits we investigate are a Fabry-Perot cavity, a Mach- Zehnder interferometric structure, and a Michelson interferometer. Especially residual reflections coming from angled facets and back-reflections in MMIs are shown to be the main parasitic effects in the investigated circuits. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Original languageEnglish
Title of host publicationIntegrated Optics: Physics and Simulations, 15 April 2013, Prague, Czech Republic
EditorsP. Cheben, J. Ctyroký;, I. Molina-Fernandez
Place of PublicationBellingham
PublisherSPIE
Pages878104-1/9
DOIs
Publication statusPublished - 2013
Eventconference; Integrated Optics: Physics and Simulations -
Duration: 1 Jan 2013 → …

Publication series

NameProceedings of SPIE
Volume8781
ISSN (Print)0277-786X

Conference

Conferenceconference; Integrated Optics: Physics and Simulations
Period1/01/13 → …
OtherIntegrated Optics: Physics and Simulations

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    Kleijn, E., Smit, M. K., & Leijtens, X. J. M. (2013). Analysis of parasitic effects in PICs using circuit simulation. In P. Cheben, J. Ctyroký;, & I. Molina-Fernandez (Eds.), Integrated Optics: Physics and Simulations, 15 April 2013, Prague, Czech Republic (pp. 878104-1/9). (Proceedings of SPIE; Vol. 8781). SPIE. https://doi.org/10.1117/12.2016829