TY - JOUR
T1 - Analysis of a-Si:H subgap absorption spectra obtained from absolute cavity ringdown absorption spectroscopy using an empirical DOS model
AU - Aarts, I.M.P.
AU - Sanden, van de, M.C.M.
AU - Kessels, W.M.M.
PY - 2004
Y1 - 2004
N2 - The novel thin film cavity ringdown absorption technique in combination with transmission reflection spectroscopy has been employed to obtain absolute absorption spectra of a-Si:H films of 4 nm and 1031 nm thickness between photon energies of 0.7 and 4 eV. Using an empirical density-of-states (DOS) model the absorption spectra have been deconvoluted and the DOS for both films could be determined within conceivable limits. The DOS for the bulk and surface dominated films are clearly different and the dipole matrix elements for the different transitions as well as the resulting dipole matrix function is discussed.
AB - The novel thin film cavity ringdown absorption technique in combination with transmission reflection spectroscopy has been employed to obtain absolute absorption spectra of a-Si:H films of 4 nm and 1031 nm thickness between photon energies of 0.7 and 4 eV. Using an empirical density-of-states (DOS) model the absorption spectra have been deconvoluted and the DOS for both films could be determined within conceivable limits. The DOS for the bulk and surface dominated films are clearly different and the dipole matrix elements for the different transitions as well as the resulting dipole matrix function is discussed.
U2 - 10.1016/j.jnoncrysol.2004.03.100
DO - 10.1016/j.jnoncrysol.2004.03.100
M3 - Article
VL - 338-340
SP - 408
EP - 411
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
SN - 0022-3093
ER -