Analysis and Optimization of Nonlinear Diode Grids for Shielding of Enclosures With Apertures

Cheng Yang (Corresponding author), Torben Wendt, Marco De Stefano, Marc Kopf, Christopher Becker, Stefano Grivet-Talocia, Christian Schuster

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Lumped-element grids provide an attractive option for wave propagation control in electromagnetic compatibility (EMC) engineering. This article investigates the peak shielding effectiveness (SE) of a diode grid used for protection of enclosures with apertures against high-intensity radiation fields (HIRFs). The nonlinearly loaded aperture is investigated with an efficient hybrid field-circuit simulation approach. Numerical experiments show that design aspects, e.g., aperture and enclosure size, grid density, impedance characteristic of lumped loads, play an important role in the field transmission through a diode grid which is nonlinear and time-variant. With a physics-based analysis of the interaction between the grid and the enclosure-backed aperture, nonlinear shielding techniques are identified that allow a control of the peak SE between 0 and 26 dB in novel ways. For the first time, the peak SE curve of a diode grid is demonstrated with four different field intensity dependencies, i.e., intensity low-pass, intensity high-pass, intensity bandpass, and intensity band-stop selectivities from tens V/m to hundreds of V/m. By considering design aspects into a two-step optimization procedure, practical guidelines are provided for the nonlinear shielding implementation.
Original languageEnglish
Number of pages12
JournalIEEE Transactions on Electromagnetic Compatibility
VolumeXX
Issue numberX
DOIs
Publication statusAccepted/In press - 2021
Externally publishedYes

Keywords

  • Apertures
  • band-stop
  • Bandpass
  • Computational modeling
  • diode grids
  • field intensity selectivity
  • guideline
  • hybrid simulation
  • Integrated circuit modeling
  • Load modeling
  • nonlinear shielding
  • Optimization
  • Switches
  • Transient analysis

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