Analysis and experimental validation of processor load for event-driven controllers

J.H. Sandee, P.M. Visser, W.P.M.H. Heemels

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Abstract

Event-driven controllers differ from the standard digital controllers as their sample times are generally not periodic (time equidistant). In literature several proposals for event-driven controllers are made in order to reduce the number of control updates and consequently the processor load needed for its implementation. This is possible without deteriorating the control performance significantly. However, experimental validation has not been presented in literature. This paper aims at filling this gap. Simulations, as well as experiments on a copier paper path test setup, show that a reduction in the number of control updates indeed results in a considerable reduction of the processor load, with only a small decrease of control performance. Furthermore, we present a method to predict the processor load very accurately, without having to implement the controller on a test setup. © 2006 IEEE.
Original languageEnglish
Title of host publicationProceedings of the 2006 IEEE International Conference on Control Applications, Munich, Germany, October 4-6, 2006
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages1879-1884
Number of pages6
ISBN (Print)0-7803-9796-7
DOIs
Publication statusPublished - 2006
Event2006 IEEE Conference of Control Applications (CCA 2006) - Munich, Germany
Duration: 4 Oct 20066 Oct 2006

Conference

Conference2006 IEEE Conference of Control Applications (CCA 2006)
Abbreviated titleCCA 2006
CountryGermany
CityMunich
Period4/10/066/10/06

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    Sandee, J. H., Visser, P. M., & Heemels, W. P. M. H. (2006). Analysis and experimental validation of processor load for event-driven controllers. In Proceedings of the 2006 IEEE International Conference on Control Applications, Munich, Germany, October 4-6, 2006 (pp. 1879-1884). [ThB11.5] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CACSD-CCA-ISIC.2006.4776927