Analog fault diagnosis : a fault clustering approach

S.S. Somayajula; E. Sanchez-Sinencio; J. Pineda de Gyvez

doi:10.1109/ETC.1993.246527

Analog fault diagnosis : a fault clustering approach

S.S. Somayajula, E. Sanchez-Sinencio, J. Pineda de Gyvez

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

A novel analog circuit fault diagnosis method is proposed. This method uses a neural network paradigm to cluster different faults. It is capable of dealing with the common fault models in analog circuits, namely the catastrophic and parametric faults. The proposed technique is independent of the linearity or nonlinearity of the circuit. The process parameter drifts and component tolerance effects of the circuit are well taken care of. Several fault diagnosis strategies for different problem complexities are described. The proposed methodology is illustrated by means of an operational transconductance amplifier (OTA) example

Original language	English
Title of host publication	Proceedings of the Third European Test Conference, 1993, ETC 93, 19-22 April 1993, Rotterdam, The Netherlands
Place of Publication	New York
Publisher	Institute of Electrical and Electronics Engineers
Pages	108-115
ISBN (Print)	0-8186-3360-3
DOIs	https://doi.org/10.1109/ETC.1993.246527
Publication status	Published - 1993

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10.1109/ETC.1993.246527

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title = "Analog fault diagnosis : a fault clustering approach",

abstract = "A novel analog circuit fault diagnosis method is proposed. This method uses a neural network paradigm to cluster different faults. It is capable of dealing with the common fault models in analog circuits, namely the catastrophic and parametric faults. The proposed technique is independent of the linearity or nonlinearity of the circuit. The process parameter drifts and component tolerance effects of the circuit are well taken care of. Several fault diagnosis strategies for different problem complexities are described. The proposed methodology is illustrated by means of an operational transconductance amplifier (OTA) example",

author = "S.S. Somayajula and E. Sanchez-Sinencio and {Pineda de Gyvez}, J.",

year = "1993",

doi = "10.1109/ETC.1993.246527",

language = "English",

isbn = "0-8186-3360-3",

pages = "108--115",

booktitle = "Proceedings of the Third European Test Conference, 1993, ETC 93, 19-22 April 1993, Rotterdam, The Netherlands",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

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Analog fault diagnosis : a fault clustering approach. / Somayajula, S.S.; Sanchez-Sinencio, E.; Pineda de Gyvez, J.

Proceedings of the Third European Test Conference, 1993, ETC 93, 19-22 April 1993, Rotterdam, The Netherlands. New York : Institute of Electrical and Electronics Engineers, 1993. p. 108-115.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Analog fault diagnosis : a fault clustering approach

AU - Somayajula, S.S.

AU - Sanchez-Sinencio, E.

AU - Pineda de Gyvez, J.

PY - 1993

Y1 - 1993

N2 - A novel analog circuit fault diagnosis method is proposed. This method uses a neural network paradigm to cluster different faults. It is capable of dealing with the common fault models in analog circuits, namely the catastrophic and parametric faults. The proposed technique is independent of the linearity or nonlinearity of the circuit. The process parameter drifts and component tolerance effects of the circuit are well taken care of. Several fault diagnosis strategies for different problem complexities are described. The proposed methodology is illustrated by means of an operational transconductance amplifier (OTA) example

AB - A novel analog circuit fault diagnosis method is proposed. This method uses a neural network paradigm to cluster different faults. It is capable of dealing with the common fault models in analog circuits, namely the catastrophic and parametric faults. The proposed technique is independent of the linearity or nonlinearity of the circuit. The process parameter drifts and component tolerance effects of the circuit are well taken care of. Several fault diagnosis strategies for different problem complexities are described. The proposed methodology is illustrated by means of an operational transconductance amplifier (OTA) example

U2 - 10.1109/ETC.1993.246527

DO - 10.1109/ETC.1993.246527

M3 - Conference contribution

SN - 0-8186-3360-3

SP - 108

EP - 115

BT - Proceedings of the Third European Test Conference, 1993, ETC 93, 19-22 April 1993, Rotterdam, The Netherlands

PB - Institute of Electrical and Electronics Engineers

CY - New York

ER -

Analog fault diagnosis : a fault clustering approach

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