An SRAM weak cell fault model and a DFT technique with a programmable detection threshold

A. Pavlov; M. Sachdev; J. Pineda de Gyvez

doi:10.1109/TEST.2004.1387366

An SRAM weak cell fault model and a DFT technique with a programmable detection threshold

A. Pavlov, M. Sachdev, J. Pineda de Gyvez

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

16 Citations (Scopus)

272 Downloads (Pure)

Abstract

SRAM cell stability has become an important design and test issue owing to significant process spreads, non-ideal operational conditions, and subtle manufacturing defects in scaled-down geometries. In this article, we carry out an extensive SRAM SNM sensitivity analysis and propose an SRAM cell stability fault model for weak cell detection. This fault model is used to design and verify a proposed digitally programmable design-for-test (DFT) technique targeting the weak cell detection in embedded SRAMs (eSRAM).

Original language	English
Title of host publication	Test Conference, 2004. Proceedings. ITC 2004. International, October 26-28, Ontario Canada
Publisher	Institute of Electrical and Electronics Engineers
Pages	1006-1015
ISBN (Print)	0-7803-8580-2
DOIs	https://doi.org/10.1109/TEST.2004.1387366
Publication status	Published - 2004

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title = "An SRAM weak cell fault model and a DFT technique with a programmable detection threshold",

abstract = "SRAM cell stability has become an important design and test issue owing to significant process spreads, non-ideal operational conditions, and subtle manufacturing defects in scaled-down geometries. In this article, we carry out an extensive SRAM SNM sensitivity analysis and propose an SRAM cell stability fault model for weak cell detection. This fault model is used to design and verify a proposed digitally programmable design-for-test (DFT) technique targeting the weak cell detection in embedded SRAMs (eSRAM).",

author = "A. Pavlov and M. Sachdev and {Pineda de Gyvez}, J.",

year = "2004",

doi = "10.1109/TEST.2004.1387366",

language = "English",

isbn = "0-7803-8580-2",

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booktitle = "Test Conference, 2004. Proceedings. ITC 2004. International, October 26-28, Ontario Canada",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

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An SRAM weak cell fault model and a DFT technique with a programmable detection threshold. / Pavlov, A.; Sachdev, M.; Pineda de Gyvez, J.
Test Conference, 2004. Proceedings. ITC 2004. International, October 26-28, Ontario Canada. Institute of Electrical and Electronics Engineers, 2004. p. 1006-1015.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - An SRAM weak cell fault model and a DFT technique with a programmable detection threshold

AU - Pavlov, A.

AU - Sachdev, M.

AU - Pineda de Gyvez, J.

PY - 2004

Y1 - 2004

N2 - SRAM cell stability has become an important design and test issue owing to significant process spreads, non-ideal operational conditions, and subtle manufacturing defects in scaled-down geometries. In this article, we carry out an extensive SRAM SNM sensitivity analysis and propose an SRAM cell stability fault model for weak cell detection. This fault model is used to design and verify a proposed digitally programmable design-for-test (DFT) technique targeting the weak cell detection in embedded SRAMs (eSRAM).

AB - SRAM cell stability has become an important design and test issue owing to significant process spreads, non-ideal operational conditions, and subtle manufacturing defects in scaled-down geometries. In this article, we carry out an extensive SRAM SNM sensitivity analysis and propose an SRAM cell stability fault model for weak cell detection. This fault model is used to design and verify a proposed digitally programmable design-for-test (DFT) technique targeting the weak cell detection in embedded SRAMs (eSRAM).

U2 - 10.1109/TEST.2004.1387366

DO - 10.1109/TEST.2004.1387366

M3 - Conference contribution

SN - 0-7803-8580-2

SP - 1006

EP - 1015

BT - Test Conference, 2004. Proceedings. ITC 2004. International, October 26-28, Ontario Canada

PB - Institute of Electrical and Electronics Engineers

ER -

An SRAM weak cell fault model and a DFT technique with a programmable detection threshold

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