An old satellite antenna measured on a new test facility at Eindhoven University of technology

C.G.M. van 't Klooster, A.G. Tijhuis, A.B. Smolders

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Results are presented of planar near-field (NF) antenna measurements at Eindhoven University of Technology (TU=e). The antenna under test (AUT) is an engineering model (EM) of a satellite antenna for European coverage from Geostationary Orbit (GEO). It has a shaped beam with Polarisation isolation to allow frequency reuse in a front-fed reflector configuration. Electrical and mechanical axis are not co-incident, making alignment procedures important. A prime reason for publication is that acceptable results can already be obtained with a relatively small NF scan-plane. A comparison is shown with results obtained 25 years ago. It shows also that the AUT with its composite reflector has been kept in a stabile state.

Original languageEnglish
Title of host publication2016 21st International Conference on Microwave, Radar and Wireless Communications, MIKON 2016
PublisherInstitute of Electrical and Electronics Engineers
Number of pages4
ISBN (Print)9781509022144
DOIs
Publication statusPublished - 14 Jun 2016
Event21st International Conference on Microwave, Radar and Wireless Communications (MIKON 2016) - Krakow, Poland
Duration: 9 May 201611 May 2016
Conference number: 21
http://mrw2016.org/

Conference

Conference21st International Conference on Microwave, Radar and Wireless Communications (MIKON 2016)
Abbreviated titleMIKON 2016
CountryPoland
CityKrakow
Period9/05/1611/05/16
Internet address

Keywords

  • Antenna measurement
  • Near field scanning
  • Satellite antenna testing

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    van 't Klooster, C. G. M., Tijhuis, A. G., & Smolders, A. B. (2016). An old satellite antenna measured on a new test facility at Eindhoven University of technology. In 2016 21st International Conference on Microwave, Radar and Wireless Communications, MIKON 2016 [7491997] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/MIKON.2016.7491997