An intra-cell defect grading tool

Alberto Bosio; Luigi Dilillo; Patrick Girard; Aida Todri-Sanial; Arnaud Virazel; S. Bernabovi; Paolo Bernardi

doi:10.1109/DDECS.2014.6868814

An intra-cell defect grading tool

Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

Abstract

With the continuous scaling down of the transistor size, the so-called intra-cell defects are more and more frequent. In this paper we propose a defect grading tool able to evaluate the efficiency of the applied test set. The test set efficiency is quantified w.r.t. the intra-cell defect coverage and the intra-cell diagnosis resolution.

Original language	English
Title of host publication	17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Publisher	Institute of Electrical and Electronics Engineers
Pages	298-301
Number of pages	4
ISBN (Electronic)	978-1-4799-4558-0
ISBN (Print)	978-1-4799-4560-3
DOIs	https://doi.org/10.1109/DDECS.2014.6868814
Publication status	Published - 31 Jul 2014
Externally published	Yes
Event	17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Warsaw, Poland Duration: 23 Apr 2014 → 25 Apr 2014 Conference number: 17 http://ddecs2014.imio.pw.edu.pl/

Conference

Conference	17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Abbreviated title	DDECS
Country/Territory	Poland
City	Warsaw
Period	23/04/14 → 25/04/14
Internet address	http://ddecs2014.imio.pw.edu.pl/

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10.1109/DDECS.2014.6868814

Cite this

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title = "An intra-cell defect grading tool",

abstract = "With the continuous scaling down of the transistor size, the so-called intra-cell defects are more and more frequent. In this paper we propose a defect grading tool able to evaluate the efficiency of the applied test set. The test set efficiency is quantified w.r.t. the intra-cell defect coverage and the intra-cell diagnosis resolution.",

author = "Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri-Sanial and Arnaud Virazel and S. Bernabovi and Paolo Bernardi",

year = "2014",

month = jul,

day = "31",

doi = "10.1109/DDECS.2014.6868814",

language = "English",

isbn = "978-1-4799-4560-3",

pages = "298--301",

booktitle = "17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems ; Conference date: 23-04-2014 Through 25-04-2014",

url = "http://ddecs2014.imio.pw.edu.pl/",

}

Bosio, A, Dilillo, L, Girard, P, Todri-Sanial, A, Virazel, A, Bernabovi, S & Bernardi, P 2014, An intra-cell defect grading tool. in 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Institute of Electrical and Electronics Engineers, pp. 298-301, 17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Warsaw, Poland, 23/04/14. https://doi.org/10.1109/DDECS.2014.6868814

TY - GEN

T1 - An intra-cell defect grading tool

AU - Bosio, Alberto

AU - Dilillo, Luigi

AU - Girard, Patrick

AU - Todri-Sanial, Aida

AU - Virazel, Arnaud

AU - Bernabovi, S.

AU - Bernardi, Paolo

N1 - Conference code: 17

PY - 2014/7/31

Y1 - 2014/7/31

N2 - With the continuous scaling down of the transistor size, the so-called intra-cell defects are more and more frequent. In this paper we propose a defect grading tool able to evaluate the efficiency of the applied test set. The test set efficiency is quantified w.r.t. the intra-cell defect coverage and the intra-cell diagnosis resolution.

AB - With the continuous scaling down of the transistor size, the so-called intra-cell defects are more and more frequent. In this paper we propose a defect grading tool able to evaluate the efficiency of the applied test set. The test set efficiency is quantified w.r.t. the intra-cell defect coverage and the intra-cell diagnosis resolution.

U2 - 10.1109/DDECS.2014.6868814

DO - 10.1109/DDECS.2014.6868814

M3 - Conference contribution

SN - 978-1-4799-4560-3

SP - 298

EP - 301

BT - 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

PB - Institute of Electrical and Electronics Engineers

T2 - 17th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems

Y2 - 23 April 2014 through 25 April 2014

ER -

An intra-cell defect grading tool

Abstract

Conference

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