An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure

Darian Verdy Retianza; Jeroen van Duivenbode; Henk Huisman

doi:10.23919/ICEMS50442.2020.9290980

An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure

Darian Verdy Retianza, Jeroen van Duivenbode, Henk Huisman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

7 Downloads (Pure)

Abstract

A short circuit detection based on a Stray Voltage Capture (SVC) cannot robustly detect a Hard Switching Fault (HSF) if an additional stray inductance is present in the short circuit path. Therefore, this paper proposes an extension of the Stray Voltage Capture (ESVC) method to detect a HSF based on the integration of the SVC output. The result shows that a HSF is detected in the MOSFET linear region and can be easily implemented in any converter with a Half-Bridge structure.

Original language	English
Title of host publication	23rd International Conference on Electrical Machines and Systems, ICEMS 2020
Publisher	Institute of Electrical and Electronics Engineers
Pages	1002-1007
Number of pages	6
ISBN (Electronic)	9784886864192
DOIs	https://doi.org/10.23919/ICEMS50442.2020.9290980
Publication status	Published - 22 Dec 2020
Event	2020 International Conference on Electrical Machines and Systems, ICEMS 2020 - Hamamatsu, Japan Duration: 24 Nov 2020 → 27 Nov 2020 Conference number: 23

Conference

Conference	2020 International Conference on Electrical Machines and Systems, ICEMS 2020
Abbreviated title	ICEMS
Country/Territory	Japan
City	Hamamatsu
Period	24/11/20 → 27/11/20

Keywords

Extension
Half-Bridge
Hard Switching Fault
MOSFET
Stray Voltage Capture

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10.23919/ICEMS50442.2020.9290980

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Verdy Retianza, D., van Duivenbode, J., & Huisman, H. (2020). An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure. In 23rd International Conference on Electrical Machines and Systems, ICEMS 2020 (pp. 1002-1007). Article 9290980 Institute of Electrical and Electronics Engineers. https://doi.org/10.23919/ICEMS50442.2020.9290980

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title = "An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure",

abstract = "A short circuit detection based on a Stray Voltage Capture (SVC) cannot robustly detect a Hard Switching Fault (HSF) if an additional stray inductance is present in the short circuit path. Therefore, this paper proposes an extension of the Stray Voltage Capture (ESVC) method to detect a HSF based on the integration of the SVC output. The result shows that a HSF is detected in the MOSFET linear region and can be easily implemented in any converter with a Half-Bridge structure. ",

keywords = "Extension, Half-Bridge, Hard Switching Fault, MOSFET, Stray Voltage Capture",

author = "{Verdy Retianza}, Darian and {van Duivenbode}, Jeroen and Henk Huisman",

year = "2020",

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doi = "10.23919/ICEMS50442.2020.9290980",

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booktitle = "23rd International Conference on Electrical Machines and Systems, ICEMS 2020",

publisher = "Institute of Electrical and Electronics Engineers",

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note = "2020 International Conference on Electrical Machines and Systems, ICEMS 2020, ICEMS ; Conference date: 24-11-2020 Through 27-11-2020",

}

Verdy Retianza, D , van Duivenbode, J & Huisman, H 2020, An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure. in 23rd International Conference on Electrical Machines and Systems, ICEMS 2020., 9290980, Institute of Electrical and Electronics Engineers, pp. 1002-1007, 2020 International Conference on Electrical Machines and Systems, ICEMS 2020, Hamamatsu, Japan, 24/11/20. https://doi.org/10.23919/ICEMS50442.2020.9290980

An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure. / Verdy Retianza, Darian ; van Duivenbode, Jeroen ; Huisman, Henk.
23rd International Conference on Electrical Machines and Systems, ICEMS 2020. Institute of Electrical and Electronics Engineers, 2020. p. 1002-1007 9290980.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure

AU - Verdy Retianza, Darian

AU - van Duivenbode, Jeroen

AU - Huisman, Henk

N1 - Conference code: 23

PY - 2020/12/22

Y1 - 2020/12/22

N2 - A short circuit detection based on a Stray Voltage Capture (SVC) cannot robustly detect a Hard Switching Fault (HSF) if an additional stray inductance is present in the short circuit path. Therefore, this paper proposes an extension of the Stray Voltage Capture (ESVC) method to detect a HSF based on the integration of the SVC output. The result shows that a HSF is detected in the MOSFET linear region and can be easily implemented in any converter with a Half-Bridge structure.

AB - A short circuit detection based on a Stray Voltage Capture (SVC) cannot robustly detect a Hard Switching Fault (HSF) if an additional stray inductance is present in the short circuit path. Therefore, this paper proposes an extension of the Stray Voltage Capture (ESVC) method to detect a HSF based on the integration of the SVC output. The result shows that a HSF is detected in the MOSFET linear region and can be easily implemented in any converter with a Half-Bridge structure.

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KW - Half-Bridge

KW - Hard Switching Fault

KW - MOSFET

KW - Stray Voltage Capture

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An Extension of Stray Voltage Capture for Hard Switching Fault Detection in Power Electronics with Half-Bridge Structure

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