Abstract
A remote argon/hydrogen plasma is used to deposit amorphous hydrogenated silicon. The plasma is generated in a DC thermal arc (typical operating conditions 0.5 bar, 5 kW) and expands into a low pressure chamber (20 Pa) thus creating a plasma jet with a typical flow velocity of 103 m/s. Pure silane is injected into the jet immediately after the nozzle, in a typical flow mixture of Ar:H2:SiH4=55:10:6 scc/s. The electron temperature in the jet is low (typ. 0.3 eV): silane radicals are thought to be produced mainly by hydrogen abstraction, but also by a sequence of dissociative charge exchange and consecutive dissociative recombination. In-situ ellipsometry yields refractive indices of 3.6-4.2 at 632.8 nm and growth rates of 10-20 nm/s. FTIR analysis yields a hydrogen content of 9-25 at.% and refractive indices of 2.7-3.3 in the infrared. The SiH density decreases with increasing hydrogen content, whereas the SiH2 density increases. Above 11 at.%, the majority of hydrogen is bonded in the SiH2 configuration. The optical bandgap remains constant at approximately 1.72 eV. The photoconductivity is of the order 10-6 (Ωcm)-1 and the photoresponse 106.
Original language | English |
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Title of host publication | Amorphous silicon technology 1995 : symposium, April 18-21, San Francisco, California, U.S.A. |
Editors | M. Hack, E.A. Schiff, A. Madan |
Place of Publication | Pittsburgh |
Publisher | Materials Research Society |
Pages | 33-38 |
Number of pages | 6 |
ISBN (Print) | 3-540-67378-4 |
Publication status | Published - 1995 |
Event | 1995 MRS Spring Meeting - San Francisco, United States Duration: 18 Apr 1995 → 21 Apr 1995 https://www.mrs.org/spring1995 |
Publication series
Name | Materials Research Society Symposium Proceedings |
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Volume | 377 |
ISSN (Print) | 0272-9172 |
Conference
Conference | 1995 MRS Spring Meeting |
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Country/Territory | United States |
City | San Francisco |
Period | 18/04/95 → 21/04/95 |
Internet address |