Abstract
In this cross-sectional scanning tunnelling microscopy study we investigate the indium flush method as a means to control the height of self-assembled InGaAs quantum dots and wetting layers. The results show that application of an indium flush step during growth results in flattened dots and a reduced wetting layer of which the height can be precisely controlled by varying the height of the first capping layer. © 2010 IOP Publishing Ltd. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 215705
Original language | English |
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Article number | 215705 |
Pages (from-to) | 215705-1/4 |
Number of pages | 4 |
Journal | Nanotechnology |
Volume | 21 |
Issue number | 21 |
DOIs | |
Publication status | Published - 2010 |