R. ten Have, B.J.D. Vermulst, J. Duivenbode, van
Research output: Contribution to conference › Poster
TY - CONF
T1 - An approach to lifetime estimation of SiC MOSFETs subjected to thermal stress
AU - ten Have, R.
AU - Vermulst, B.J.D.
AU - Duivenbode, van, J.
N1 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM Europe 2015), 19-21 May 2015, Nuremberg
PY - 2015
Y1 - 2015
M3 - Poster