A novel digital technique for efficient calibration of static errors in high-speed, high-resolution, multi-step ADCs is proposed. The parameter update within the calibration method is extended to include and correct effects of temperature and process variations. Additionally, to guide the verification process with the information obtained through monitoring process variations, expectation-maximization method is employed. The algorithm is evaluated on a prototype multi-step ADC converter with embedded dedicated sensors fabricated in standard single poly, six metal 0.09-µ¿¿ CMOS.
|Title of host publication||Proceedings of the 2010 IEEE 10th International Conference on Signal Processing (ICSP), 24-28 October 2010, Beijing, China|
|Place of Publication||Piscataway|
|Publisher||Institute of Electrical and Electronics Engineers|
|Publication status||Published - 2010|