An adaptive digital caliration of multi-step A/D converters.

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Abstract

A novel digital technique for efficient calibration of static errors in high-speed, high-resolution, multi-step ADCs is proposed. The parameter update within the calibration method is extended to include and correct effects of temperature and process variations. Additionally, to guide the verification process with the information obtained through monitoring process variations, expectation-maximization method is employed. The algorithm is evaluated on a prototype multi-step ADC converter with embedded dedicated sensors fabricated in standard single poly, six metal 0.09-樨 CMOS.
Original languageEnglish
Title of host publicationProceedings of the 2010 IEEE 10th International Conference on Signal Processing (ICSP), 24-28 October 2010, Beijing, China
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages2456-2459
ISBN (Print)978-1-4244-5897-4
DOIs
Publication statusPublished - 2010

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