Abstract
The requirement to control each possible degree of freedom of digital circuits becomes a necessity in deep submicron technologies. This requires getting a set of monitors to measure each one of the parameters of interest. This paper describes a monitor fabricated in a 90nm CMOS technology which is able to estimate the circuit activity. The output of such monitor can be used as a tool to decide how to adjust the circuit working conditions to get the best power/performance circuit response. The paper presents the implementation and experimental results of a test chip including such monitor.
Original language | English |
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Pages (from-to) | 80-86 |
Number of pages | 6 |
Journal | Journal of Low Power Electronics |
Volume | 2 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2006 |
Externally published | Yes |