An Accurate Probabilistic Reliability Model for Silicon PUFs

Roel Maes

doi:10.1007/978-3-642-40349-1_5

An Accurate Probabilistic Reliability Model for Silicon PUFs

Roel Maes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

72 Citations (Scopus)

Abstract

The power of an accurate model for describing a physical process or designing a physical system is beyond doubt. The currently used
reliability model for physically unclonable functions (PUFs) assumes an
equally likely error for every evaluation of every PUF response bit. This
limits an accurate description since experiments show that certain responses are more error-prone than others, but this fixed error rate model only captures average case behavior. We introduce a new PUF reliability model taking this observed heterogeneous nature of PUF cells into account. An extensive experimental validation demonstrates the new predicted distributions describe the empirically observed data statistics almost perfectly, even considering sensitivity to operational temperature. This allows studying PUF reliability behavior in full detail, including average and worst case probabilities, and is an invaluable tool for designing more efficient and better adapted PUFs and PUF-based systems.

Original language	English
Title of host publication	Cryptographic Hardware and Embedded Systems - CHES 2013
Subtitle of host publication	15th International Workshop, Santa Barbara, CA, USA, August 20-23, 2013, Proceedings
Editors	Guido Bertoni, Jean-Sébastien Coron
Publisher	Springer
Pages	73-89
Number of pages	17
ISBN (Electronic)	978-3-642-40349-1
ISBN (Print)	978-3-642-40348-4
DOIs	https://doi.org/10.1007/978-3-642-40349-1_5
Publication status	Published - 19 Jul 2013
Externally published	Yes
Event	Cryptographic Hardware and Embedded Systems, 15th International Workshop, CHES 2013 - Santa Barbara, United States Duration: 20 Aug 2023 → 23 Aug 2023

Publication series

Name	Lecture Notes in Computer Science (LNCS)
Volume	8086
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Conference

Conference	Cryptographic Hardware and Embedded Systems, 15th International Workshop, CHES 2013
Abbreviated title	CHES 2013
Country/Territory	United States
City	Santa Barbara
Period	20/08/23 → 23/08/23

Access to Document

10.1007/978-3-642-40349-1_5

Cite this

Maes, R. (2013). An Accurate Probabilistic Reliability Model for Silicon PUFs. In G. Bertoni, & J.-S. Coron (Eds.), Cryptographic Hardware and Embedded Systems - CHES 2013: 15th International Workshop, Santa Barbara, CA, USA, August 20-23, 2013, Proceedings (pp. 73-89). (Lecture Notes in Computer Science (LNCS); Vol. 8086). Springer. https://doi.org/10.1007/978-3-642-40349-1_5

@inproceedings{f4dfb84f8d0444488ec54963417d59e3,

title = "An Accurate Probabilistic Reliability Model for Silicon PUFs",

abstract = "The power of an accurate model for describing a physical process or designing a physical system is beyond doubt. The currently used reliability model for physically unclonable functions (PUFs) assumes an equally likely error for every evaluation of every PUF response bit. This limits an accurate description since experiments show that certain responses are more error-prone than others, but this fixed error rate model only captures average case behavior. We introduce a new PUF reliability model taking this observed heterogeneous nature of PUF cells into account. An extensive experimental validation demonstrates the new predicted distributions describe the empirically observed data statistics almost perfectly, even considering sensitivity to operational temperature. This allows studying PUF reliability behavior in full detail, including average and worst case probabilities, and is an invaluable tool for designing more efficient and better adapted PUFs and PUF-based systems.",

author = "Roel Maes",

year = "2013",

month = jul,

day = "19",

doi = "10.1007/978-3-642-40349-1\_5",

language = "English",

isbn = "978-3-642-40348-4",

series = "Lecture Notes in Computer Science (LNCS)",

publisher = "Springer",

pages = "73--89",

editor = "Guido Bertoni and Jean-S{\'e}bastien Coron",

booktitle = "Cryptographic Hardware and Embedded Systems - CHES 2013",

address = "Germany",

note = "Cryptographic Hardware and Embedded Systems, 15th International Workshop, CHES 2013, CHES 2013 ; Conference date: 20-08-2023 Through 23-08-2023",

}

Maes, R 2013, An Accurate Probabilistic Reliability Model for Silicon PUFs. in G Bertoni & J-S Coron (eds), Cryptographic Hardware and Embedded Systems - CHES 2013: 15th International Workshop, Santa Barbara, CA, USA, August 20-23, 2013, Proceedings. Lecture Notes in Computer Science (LNCS), vol. 8086, Springer, pp. 73-89, Cryptographic Hardware and Embedded Systems, 15th International Workshop, CHES 2013, Santa Barbara, United States, 20/08/23. https://doi.org/10.1007/978-3-642-40349-1_5

An Accurate Probabilistic Reliability Model for Silicon PUFs. / Maes, Roel.
Cryptographic Hardware and Embedded Systems - CHES 2013: 15th International Workshop, Santa Barbara, CA, USA, August 20-23, 2013, Proceedings. ed. / Guido Bertoni; Jean-Sébastien Coron. Springer, 2013. p. 73-89 (Lecture Notes in Computer Science (LNCS); Vol. 8086).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - An Accurate Probabilistic Reliability Model for Silicon PUFs

AU - Maes, Roel

PY - 2013/7/19

Y1 - 2013/7/19

N2 - The power of an accurate model for describing a physical process or designing a physical system is beyond doubt. The currently used reliability model for physically unclonable functions (PUFs) assumes an equally likely error for every evaluation of every PUF response bit. This limits an accurate description since experiments show that certain responses are more error-prone than others, but this fixed error rate model only captures average case behavior. We introduce a new PUF reliability model taking this observed heterogeneous nature of PUF cells into account. An extensive experimental validation demonstrates the new predicted distributions describe the empirically observed data statistics almost perfectly, even considering sensitivity to operational temperature. This allows studying PUF reliability behavior in full detail, including average and worst case probabilities, and is an invaluable tool for designing more efficient and better adapted PUFs and PUF-based systems.

AB - The power of an accurate model for describing a physical process or designing a physical system is beyond doubt. The currently used reliability model for physically unclonable functions (PUFs) assumes an equally likely error for every evaluation of every PUF response bit. This limits an accurate description since experiments show that certain responses are more error-prone than others, but this fixed error rate model only captures average case behavior. We introduce a new PUF reliability model taking this observed heterogeneous nature of PUF cells into account. An extensive experimental validation demonstrates the new predicted distributions describe the empirically observed data statistics almost perfectly, even considering sensitivity to operational temperature. This allows studying PUF reliability behavior in full detail, including average and worst case probabilities, and is an invaluable tool for designing more efficient and better adapted PUFs and PUF-based systems.

U2 - 10.1007/978-3-642-40349-1_5

DO - 10.1007/978-3-642-40349-1_5

M3 - Conference contribution

SN - 978-3-642-40348-4

T3 - Lecture Notes in Computer Science (LNCS)

SP - 73

EP - 89

BT - Cryptographic Hardware and Embedded Systems - CHES 2013

A2 - Bertoni, Guido

A2 - Coron, Jean-Sébastien

PB - Springer

T2 - Cryptographic Hardware and Embedded Systems, 15th International Workshop, CHES 2013

Y2 - 20 August 2023 through 23 August 2023

ER -

An Accurate Probabilistic Reliability Model for Silicon PUFs

Abstract

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