Ageing mechanism of fuses for semiconductor protection

X.Z. Meng; J.G.J. Sloot; H.U. Haas

Ageing mechanism of fuses for semiconductor protection

X.Z. Meng, J.G.J. Sloot, H.U. Haas

Electrical Energy Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. Vth International Conference on Electric Fuses and Applications
Pages	180-187
Publication status	Published - 1995
Event	conference; Proc. Vth International Conference on Electric Fuses and Applications, Ilmenau, Germany, 1 September 1995 - Duration: 1 Jan 1995 → …

Conference

Conference	conference; Proc. Vth International Conference on Electric Fuses and Applications, Ilmenau, Germany, 1 September 1995
Period	1/01/95 → …
Other	Proc. Vth International Conference on Electric Fuses and Applications, Ilmenau, Germany, 1 September 1995

Cite this

@inproceedings{d49bd11c1afe435686c87c4c9dff0cc2,

title = "Ageing mechanism of fuses for semiconductor protection",

author = "X.Z. Meng and J.G.J. Sloot and H.U. Haas",

year = "1995",

language = "English",

pages = "180--187",

booktitle = "Proc. Vth International Conference on Electric Fuses and Applications",

note = "conference; Proc. Vth International Conference on Electric Fuses and Applications, Ilmenau, Germany, 1 September 1995 ; Conference date: 01-01-1995",

}

TY - GEN

T1 - Ageing mechanism of fuses for semiconductor protection

AU - Meng, X.Z.

AU - Sloot, J.G.J.

AU - Haas, H.U.

PY - 1995

Y1 - 1995

M3 - Conference contribution

SP - 180

EP - 187

BT - Proc. Vth International Conference on Electric Fuses and Applications

T2 - conference; Proc. Vth International Conference on Electric Fuses and Applications, Ilmenau, Germany, 1 September 1995

Y2 - 1 January 1995

ER -