Abstract
Aerial Infrared Thermography (aIRT) is a fast and flexible inspection method to monitor and assess utility-scale photovoltaic (PV) power plants. The literature is abundant on aIRT for crystalline silicon (c-Si) modules, but very little investigation has been carried out and reported thin-film PV. As Cadmium Telluride (CdTe) is currently the leading thin-film technology, and a good performer in warm and sunny climates, this paper aims to investigate the application of aIRT on CdTe PV plants in Brazil. Results demonstrate that aIRT is a reliable, cost-effective and fast method to detect faults on CdTe modules in large-scale PV plants.
Original language | English |
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Title of host publication | 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1335-1340 |
Number of pages | 6 |
ISBN (Electronic) | 9781728104942 |
DOIs | |
Publication status | Published - Jun 2019 |
Externally published | Yes |
Event | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019 |
Conference
Conference | 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 |
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Country/Territory | United States |
City | Chicago |
Period | 16/06/19 → 21/06/19 |
Keywords
- Aerial Infrared Thermography (aIRT)
- Cadmium Telluride (CdTe)
- Fault Inspection
- Photovoltaic Power Plants
- Thin-Film
- Unmanned Aerial Vehicles (UAV)