Advanced motion control for next-generation precision mechatronics: Challenges for control, identification, and learning

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Abstract

Manufacturing equipment and scientific instruments, including wafer scanners, printers, microscopes, and medical imaging scanners, require accurate and fast motions. Increasing requirements necessitate enhanced control performance. The aim of this paper is to identify several challenges for advanced motion control originating from these increasing accu- racy, speed, and cost requirements. For instance, flexible mechanics must be explicitly addressed through overactuation, oversensing, inferential control, and position-dependent control. This in turn requires suitable models of appropriate complexity, which are identified and learned from inexpensive experimental data. Several ongoing developments are outlined that constitute a part of an overall framework for control, identification, and learning of complex motion systems. In turn, this may pave the way for new mechatronic design principles, leading to fast lightweight machines where the spatio-temporal flexible mechanics are explicitly compensated through advanced motion control.
Original languageEnglish
Title of host publicationIEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON)
Pages1-12
Number of pages12
Publication statusPublished - 7 Mar 2017
Event3rd IEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON 2017) - Nagaoka, Japan
Duration: 6 Mar 20177 Mar 2017
Conference number: 3
http://www2.iee.or.jp/~diic/samcon/2017/index.html?no-cache?171205

Conference

Conference3rd IEEJ International Workshop on Sensing, Actuation, Motion Control, and Optimization (SAMCON 2017)
Abbreviated titleSAMCON2017
CountryJapan
CityNagaoka
Period6/03/177/03/17
Internet address

Keywords

  • Mechatronics, motion control, robust control, multivariable control, system identification, iterative learning control

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