Adjoint transient sensitivity analysis in circuit simulation

Z. Ilievski; H. Xu; A. Verhoeven; E.J.W. Maten, ter; W.H.A. Schilders; R.M.M. Mattheij

doi:10.1007/978-3-540-71980-9_18

Adjoint transient sensitivity analysis in circuit simulation

Z. Ilievski, H. Xu, A. Verhoeven, E.J.W. Maten, ter, W.H.A. Schilders, R.M.M. Mattheij

Scientific Computing

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

Sensitivity analysis is an important tool that can be used to assess and improve the design and accuracy of a model describing an electronic circuit. Given a model description in the form of a set of differential-algebraic equations it is possible to observe how a circuit's output reacts to varying input parameters, which are introduced at the requirements stage of design. In this paper we consider the adjoint method more closely. This method is efficient when the number of parameters is large.We extend the transient sensitivity work of Petzold et al., in particular we take into account the parameter dependency of the dynamic term.We also compare the complexity of the direct and adjoint sensitivity and derive some error estimates. Finally we sketch out how Model Order Reduction techniques could be used to improve the efficiency of adjoint sensitivity analysis.

Original language	English
Title of host publication	Proceedings of the 6th International Conference on Scientific Computing in Electrical Engineering (SCEE 2006) 17-22 September 2006, Sinaia, Romania
Editors	G. Ciuprina, D. Ioan
Place of Publication	Berlin
Publisher	Springer
Pages	183-189
ISBN (Print)	978-3-540-71979-3
DOIs	https://doi.org/10.1007/978-3-540-71980-9_18
Publication status	Published - 2007
Event	Scientific Computing in Electrical Engineering, SCEE 2006 - Sinaia, Romania Duration: 17 Sept 2006 → 22 Sept 2006 https://scee-conferences.org/

Publication series

Name	Mathematics in Industry
Volume	11
ISSN (Print)	1612-3956

Conference

Conference	Scientific Computing in Electrical Engineering, SCEE 2006
Abbreviated title	SCEE 2006
Country/Territory	Romania
City	Sinaia
Period	17/09/06 → 22/09/06
Other	SCEE 2006, Sinaia, Romania
Internet address	https://scee-conferences.org/

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10.1007/978-3-540-71980-9_18

Cite this

Ilievski, Z., Xu, H., Verhoeven, A., Maten, ter, E. J. W., Schilders, W. H. A., & Mattheij, R. M. M. (2007). Adjoint transient sensitivity analysis in circuit simulation. In G. Ciuprina, & D. Ioan (Eds.), Proceedings of the 6th International Conference on Scientific Computing in Electrical Engineering (SCEE 2006) 17-22 September 2006, Sinaia, Romania (pp. 183-189). (Mathematics in Industry; Vol. 11). Springer. https://doi.org/10.1007/978-3-540-71980-9_18

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abstract = "Sensitivity analysis is an important tool that can be used to assess and improve the design and accuracy of a model describing an electronic circuit. Given a model description in the form of a set of differential-algebraic equations it is possible to observe how a circuit's output reacts to varying input parameters, which are introduced at the requirements stage of design. In this paper we consider the adjoint method more closely. This method is efficient when the number of parameters is large.We extend the transient sensitivity work of Petzold et al., in particular we take into account the parameter dependency of the dynamic term.We also compare the complexity of the direct and adjoint sensitivity and derive some error estimates. Finally we sketch out how Model Order Reduction techniques could be used to improve the efficiency of adjoint sensitivity analysis.",

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Ilievski, Z, Xu, H, Verhoeven, A, Maten, ter, EJW, Schilders, WHA & Mattheij, RMM 2007, Adjoint transient sensitivity analysis in circuit simulation. in G Ciuprina & D Ioan (eds), Proceedings of the 6th International Conference on Scientific Computing in Electrical Engineering (SCEE 2006) 17-22 September 2006, Sinaia, Romania. Mathematics in Industry, vol. 11, Springer, Berlin, pp. 183-189, Scientific Computing in Electrical Engineering, SCEE 2006, Sinaia, Romania, 17/09/06. https://doi.org/10.1007/978-3-540-71980-9_18

Adjoint transient sensitivity analysis in circuit simulation. / Ilievski, Z.; Xu, H.; Verhoeven, A. et al.
Proceedings of the 6th International Conference on Scientific Computing in Electrical Engineering (SCEE 2006) 17-22 September 2006, Sinaia, Romania. ed. / G. Ciuprina; D. Ioan. Berlin: Springer, 2007. p. 183-189 (Mathematics in Industry; Vol. 11).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Ilievski Z, Xu H, Verhoeven A, Maten, ter EJW, Schilders WHA, Mattheij RMM. Adjoint transient sensitivity analysis in circuit simulation. In Ciuprina G, Ioan D, editors, Proceedings of the 6th International Conference on Scientific Computing in Electrical Engineering (SCEE 2006) 17-22 September 2006, Sinaia, Romania. Berlin: Springer. 2007. p. 183-189. (Mathematics in Industry). doi: 10.1007/978-3-540-71980-9_18

Adjoint transient sensitivity analysis in circuit simulation

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