Adequate test-circuits for realistic high-power testing

R.P.P. Smeets; S. Kuivenhoven; A.G.A. Lathouwers; P.P. Leufkens

Adequate test-circuits for realistic high-power testing

R.P.P. Smeets, S. Kuivenhoven, A.G.A. Lathouwers, P.P. Leufkens

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 7th International Seminar on Switchgear & Controlgear 2008
Place of Publication	Mumbai
Publisher	SWICON
Publication status	Published - 2008
Event	conference; 7th International Seminar on Switchgear & Controlgear, Mumbai; 2008-01-21; 2008-01-22 - Duration: 21 Jan 2008 → 22 Jan 2008

Conference

Conference	conference; 7th International Seminar on Switchgear & Controlgear, Mumbai; 2008-01-21; 2008-01-22
Period	21/01/08 → 22/01/08
Other	7th International Seminar on Switchgear & Controlgear, Mumbai

Cite this

@inproceedings{5b92fc76537e437b8f41763a417d6d22,

title = "Adequate test-circuits for realistic high-power testing",

author = "R.P.P. Smeets and S. Kuivenhoven and A.G.A. Lathouwers and P.P. Leufkens",

year = "2008",

language = "English",

booktitle = "Proc. 7th International Seminar on Switchgear & Controlgear 2008",

publisher = "SWICON",

note = "conference; 7th International Seminar on Switchgear & Controlgear, Mumbai; 2008-01-21; 2008-01-22 ; Conference date: 21-01-2008 Through 22-01-2008",

}

TY - GEN

T1 - Adequate test-circuits for realistic high-power testing

AU - Smeets, R.P.P.

AU - Kuivenhoven, S.

AU - Lathouwers, A.G.A.

AU - Leufkens, P.P.

PY - 2008

Y1 - 2008

M3 - Conference contribution

BT - Proc. 7th International Seminar on Switchgear & Controlgear 2008

PB - SWICON

CY - Mumbai

T2 - conference; 7th International Seminar on Switchgear & Controlgear, Mumbai; 2008-01-21; 2008-01-22

Y2 - 21 January 2008 through 22 January 2008

ER -