Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J PHYS D APPL PHYS 52 034004)

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Content available in repository 2019 2019 2019

• 1 Article

Content available in repository

Content available in repository

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• 2019

  Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy

  Beckers, J. (Corresponding author), van de Wetering, F. M. J. H., Platier, B., van Ninhuijs, M. A. W., Brussaard, G. J. H., Banine, V. Y. & Luiten, O. J., 16 Jan 2019, In: Journal of Physics D: Applied Physics. 52, 3, 17 p., 034004.

  Research output: Contribution to journal › Article › Academic › peer-review

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  • Transients 100%
  • Photoionization 100%
  • Ultraviolet Sources 50%
  • Ionizing Radiation 50%
  • Electron Density 50%
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