Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J PHYS D APPL PHYS 52 034004)

Bart Platier (Corresponding author), F.M.J.H. van de Wetering, Mark van Ninhuijs, Gert J.H. (Seth) Brussaard, Vadim Y. Banine, O.J. (Jom) Luiten, Job Beckers

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