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Accurate thermal noise model for deep-submicron CMOS
A. J. Scholten, H. J. Tromp, L. F. Tiemeijer, R. van Langevelde, R. J. Havens, P. W.H. de Vreede, R. F.M. Roes, P. H. Woerlee, A. H. Montree, D. B.M. Klaassen
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
89
Citations
(Scopus)