Accuracy evaluation of absolute calibration in thick-target PIXE

F. Munnik

doi:10.6100/IR419251

Accuracy evaluation of absolute calibration in thick-target PIXE

F. Munnik

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)

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Abstract

After a general description of the PIXE technique, a brief comparison with other analytical techniques is presented. Different calibration methods for PIXE are then discussed, with the emphasis on the analysis of thick targets. Finally an outline of this thesis is given.

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Applied Physics
Supervisors/Advisors	de Voigt, Martien, Promotor de Goeij, J.J.M., Promotor
Award date	28 Jun 1994
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
DOIs	https://doi.org/10.6100/IR419251
Publication status	Published - 1994

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title = "Accuracy evaluation of absolute calibration in thick-target PIXE",

abstract = "After a general description of the PIXE technique, a brief comparison with other analytical techniques is presented. Different calibration methods for PIXE are then discussed, with the emphasis on the analysis of thick targets. Finally an outline of this thesis is given.",

author = "F. Munnik",

year = "1994",

doi = "10.6100/IR419251",

language = "English",

publisher = "Technische Universiteit Eindhoven",

school = "Applied Physics",

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AU - Munnik, F.

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AB - After a general description of the PIXE technique, a brief comparison with other analytical techniques is presented. Different calibration methods for PIXE are then discussed, with the emphasis on the analysis of thick targets. Finally an outline of this thesis is given.

U2 - 10.6100/IR419251

DO - 10.6100/IR419251

M3 - Phd Thesis 1 (Research TU/e / Graduation TU/e)

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -

Accuracy evaluation of absolute calibration in thick-target PIXE

Abstract

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