Accuracy evaluation of absolute calibration in thick-target PIXE

F. Munnik

    Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

    389 Downloads (Pure)

    Abstract

    After a general description of the PIXE technique, a brief comparison with other analytical techniques is presented. Different calibration methods for PIXE are then discussed, with the emphasis on the analysis of thick targets. Finally an outline of this thesis is given.
    Original languageEnglish
    QualificationDoctor of Philosophy
    Awarding Institution
    • Applied Physics
    Supervisors/Advisors
    • de Voigt, Martien, Promotor
    • de Goeij, J.J.M., Promotor
    Award date28 Jun 1994
    Place of PublicationEindhoven
    Publisher
    DOIs
    Publication statusPublished - 1994

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