About models and methods to describe chip-calorimeters and determine sample properties from the measured signal

G.W.H. Höhne; W. Winter

doi:10.1016/j.tca.2005.02.008

About models and methods to describe chip-calorimeters and determine sample properties from the measured signal

G.W.H. Höhne
, W. Winter

Mechanical Engineering

Research output: Contribution to journal › Article › Academic › peer-review

10 Citations (Scopus)

Abstract

Different models used to describe chip-calorimeters and to simulate their thermal behavior are presented together with the physical basics of heat transfer. Different methods to deconvolute the measured signals are explained. One model example for a certain chip-calorimeter is given in more detail to show the procedure

Original language	English
Pages (from-to)	169-176
Journal	Thermochimica Acta
Volume	432
Issue number	2
DOIs	https://doi.org/10.1016/j.tca.2005.02.008
Publication status	Published - 2005

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10.1016/j.tca.2005.02.008

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title = "About models and methods to describe chip-calorimeters and determine sample properties from the measured signal",

abstract = "Different models used to describe chip-calorimeters and to simulate their thermal behavior are presented together with the physical basics of heat transfer. Different methods to deconvolute the measured signals are explained. One model example for a certain chip-calorimeter is given in more detail to show the procedure",

author = "G.W.H. H{\"o}hne and W. Winter",

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AU - Winter, W.

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AB - Different models used to describe chip-calorimeters and to simulate their thermal behavior are presented together with the physical basics of heat transfer. Different methods to deconvolute the measured signals are explained. One model example for a certain chip-calorimeter is given in more detail to show the procedure

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DO - 10.1016/j.tca.2005.02.008

M3 - Article

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VL - 432

SP - 169

EP - 176

JO - Thermochimica Acta

JF - Thermochimica Acta

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ER -

About models and methods to describe chip-calorimeters and determine sample properties from the measured signal

Abstract

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