A unified experiment design framework for detection and identification in closed-loop performance diagnosis

A. Mesbah, X. Bombois, M. Forgione, J.H.A. Ludlage, P.E. Moden, H. Hjalmarsson, P.M.J. Hof, Van den

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Abstract

This paper presents a least-costly experiment design framework for closed-loop performance diagnosis using prediction error identification. The performance diagnosis methodology consists in verifying whether an identified model of the true system lies in a performance-related region of interest. The experiment design framework minimizes the overall excitation cost incurred for detecting the cause of the performance drop and re-identifying the system dynamics when the degraded performance is due to control-relevant system changes. The optimal design of excitation signals is performed for a desired detection rate and a pre-specified level of accuracy required for the re-identified model.
Original languageEnglish
Title of host publicationProceedings of the 51st IEEE Conference on Decision and Control (CDC 2012), 10-13 December 2012, Maui, Hawai
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages2152-2157
DOIs
Publication statusPublished - 2012
Event51st IEEE Conference on Decision and Control (CDC 2012) - Maui, United States
Duration: 10 Dec 201213 Dec 2012
Conference number: 51

Conference

Conference51st IEEE Conference on Decision and Control (CDC 2012)
Abbreviated titleCDC 2012
CountryUnited States
CityMaui
Period10/12/1213/12/12

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  • Cite this

    Mesbah, A., Bombois, X., Forgione, M., Ludlage, J. H. A., Moden, P. E., Hjalmarsson, H., & Hof, Van den, P. M. J. (2012). A unified experiment design framework for detection and identification in closed-loop performance diagnosis. In Proceedings of the 51st IEEE Conference on Decision and Control (CDC 2012), 10-13 December 2012, Maui, Hawai (pp. 2152-2157). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CDC.2012.6426717