A two-level approach to automated conformance testing of VHDL designs

J.R. Moonen; J.M.T. Romijn; O. Sies; J. Springintveld; L.M.G. Feijs; R.L.C. Koymans

A two-level approach to automated conformance testing of VHDL designs

J.R. Moonen, J.M.T. Romijn, O. Sies, J. Springintveld, L.M.G. Feijs, R.L.C. Koymans

Mathematics and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Testing of Communicating Systems (Proceedings IFIP TC6 10th International Workshop, IWTCS'97, Cheju Island, Korea, September 8-10, 1997)
Editors	M. Kim, S. Kang, K. Hong
Publisher	Chapman & Hall
Pages	432-447
ISBN (Print)	0-412-81730-6
Publication status	Published - 1997

Cite this

Moonen, J. R., Romijn, J. M. T., Sies, O., Springintveld, J., Feijs, L. M. G., & Koymans, R. L. C. (1997). A two-level approach to automated conformance testing of VHDL designs. In M. Kim, S. Kang, & K. Hong (Eds.), Testing of Communicating Systems (Proceedings IFIP TC6 10th International Workshop, IWTCS'97, Cheju Island, Korea, September 8-10, 1997) (pp. 432-447). Chapman & Hall.

@inproceedings{fe101a27caa746fc8e5520736b484197,

title = "A two-level approach to automated conformance testing of VHDL designs",

author = "J.R. Moonen and J.M.T. Romijn and O. Sies and J. Springintveld and L.M.G. Feijs and R.L.C. Koymans",

year = "1997",

language = "English",

isbn = "0-412-81730-6",

pages = "432--447",

editor = "M. Kim and S. Kang and K. Hong",

booktitle = "Testing of Communicating Systems (Proceedings IFIP TC6 10th International Workshop, IWTCS'97, Cheju Island, Korea, September 8-10, 1997)",

publisher = "Chapman & Hall",

address = "United Kingdom",

}

A two-level approach to automated conformance testing of VHDL designs. / Moonen, J.R.; Romijn, J.M.T.; Sies, O. et al.
Testing of Communicating Systems (Proceedings IFIP TC6 10th International Workshop, IWTCS'97, Cheju Island, Korea, September 8-10, 1997). ed. / M. Kim; S. Kang; K. Hong. Chapman & Hall, 1997. p. 432-447.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - A two-level approach to automated conformance testing of VHDL designs

AU - Moonen, J.R.

AU - Romijn, J.M.T.

AU - Sies, O.

AU - Springintveld, J.

AU - Feijs, L.M.G.

AU - Koymans, R.L.C.

PY - 1997

Y1 - 1997

M3 - Conference contribution

SN - 0-412-81730-6

SP - 432

EP - 447

BT - Testing of Communicating Systems (Proceedings IFIP TC6 10th International Workshop, IWTCS'97, Cheju Island, Korea, September 8-10, 1997)

A2 - Kim, M.

A2 - Kang, S.

A2 - Hong, K.

PB - Chapman & Hall

ER -