A two-level approach to automated conformance testing of VHDL designs

J.R. Moonen, J.M.T. Romijn, O. Sies, J. Springintveld, L.M.G. Feijs, R.L.C. Koymans

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationTesting of Communicating Systems (Proceedings IFIP TC6 10th International Workshop, IWTCS'97, Cheju Island, Korea, September 8-10, 1997)
EditorsM. Kim, S. Kang, K. Hong
PublisherChapman & Hall
ISBN (Print)0-412-81730-6
Publication statusPublished - 1997

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