A test method for analog circuits : using sensitivity analysis and the singular value decomposition

J. Spaandonk, van

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)

506 Downloads (Pure)
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Department of Electrical Engineering
Supervisors/Advisors
  • van Bokhoven, Wim, Promotor
  • Otten, Ralph, Promotor
  • Leenaerts, Domine M.W., Copromotor
Award date5 Sep 1996
Place of PublicationEindhoven
Publisher
Print ISBNs90-386-0160-3
DOIs
Publication statusPublished - 1996

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