A test method for analog circuits : using sensitivity analysis and the singular value decomposition

J. Spaandonk, van

Research output: Thesis › Phd Thesis 1 (Research TU/e / Graduation TU/e)

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Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Department of Electrical Engineering
Supervisors/Advisors	van Bokhoven, Wim, Promotor Otten, Ralph, Promotor Leenaerts, Domine M.W., Copromotor
Award date	5 Sep 1996
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Print ISBNs	90-386-0160-3
DOIs	https://doi.org/10.6100/IR463325
Publication status	Published - 1996

Cite this

@phdthesis{26a791f6de6a4783b5d06001bcea9edf,

title = "A test method for analog circuits : using sensitivity analysis and the singular value decomposition",

author = "{Spaandonk, van}, J.",

year = "1996",

doi = "10.6100/IR463325",

language = "English",

isbn = "90-386-0160-3",

publisher = "Technische Universiteit Eindhoven",

school = "Department of Electrical Engineering",

}