A study of reliability issues in clock distribution networks

Aida Todri, Malgorzata Marek-Sadowska

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Abstract

In this paper, we present a reliability study of clock mesh distribution networks. We analyze the electromigration (EM) phenomena and demonstrate their occurrence in clock mesh networks (CMN). Due to shrinking feature sizes in more advanced technologies, EM is becoming a more prominent reliability issue. Process variation, power supply noise, and clock gating are some of the factors that can increase electromigration in the clock mesh. We identity the potential EM branches by investigating current flows under various conditions. Our study shows that a clock mesh optimized for certain configurations of clock sinks may experience electromigration due to asymmetrical bidirectional currents flowing in some grid segments.
Original languageEnglish
Title of host publication2008 IEEE International Conference on Computer Design
PublisherInstitute of Electrical and Electronics Engineers
Pages101-106
Number of pages6
ISBN (Print)978-1-4244-2657-7
DOIs
Publication statusPublished - 19 Jan 2009
Externally publishedYes
Event2008 IEEE International Conference on Computer Design - Lake Tahoe, United States
Duration: 12 Oct 200815 Oct 2008

Conference

Conference2008 IEEE International Conference on Computer Design
Country/TerritoryUnited States
CityLake Tahoe
Period12/10/0815/10/08

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