A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis

O.O. Sy, M.C. Beurden, van, B.L. Michielsen, J.A.H.M. Vaessen, A.G. Tijhuis

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Abstract

A statistical characterization of random electromagnetic interactions affected by resonances is presented. It hinges on the analysis of the variance and the kurtosis to assess the intensity of the resonances. The method is illustrated by the study of a randomly varying thin wire modeled by a Pocklington integral equation.
Original languageEnglish
Title of host publicationScientific computing in electrical engineering SCEE 2008
EditorsJ. Roos, L.R.J. Costa
Place of PublicationBerlin
PublisherSpringer
Pages117-124
Number of pages8
ISBN (Print)978-3-642-12293-4
DOIs
Publication statusPublished - 2008

Publication series

NameMathematics in Industry
Volume14
ISSN (Print)1612-3956

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    Sy, O. O., Beurden, van, M. C., Michielsen, B. L., Vaessen, J. A. H. M., & Tijhuis, A. G. (2008). A statistical characterization of resonant electromagnetic interactions with thin wires : variance and kurtosis analysis. In J. Roos, & L. R. J. Costa (Eds.), Scientific computing in electrical engineering SCEE 2008 (pp. 117-124). (Mathematics in Industry; Vol. 14). Springer. https://doi.org/10.1007/978-3-642-12294-1_16