A single etch-step fabrication-tolerant polarization splitter

L.M. Augustin, J.J.G.M. Tol, van der, R. Hanfoug, W.J.M. Laat, de, M.J.E. Moosdijk, van de, P.W.L. Dijk, van, Y.S. Oei, M.K. Smit

Research output: Contribution to journalArticleAcademicpeer-review

52 Citations (Scopus)
4 Downloads (Pure)

Abstract

A tolerant single etch-step passive polarization splitter on InP/InGaAsP is designed and fabricated. The device consists of a directional coupler with a wide and a narrow waveguide. Modal birefringence of the third-order modes for transverse electric (TE) and transverse magnetic (TM) polarizations is employed to selectively couple one polarization. Tapering is applied to increase the tolerances. The devices are characterized, and the measurement results show good agreement with the beam-propagation-method simulations: a splitting ratio larger than 95% for a width range of around 100 nm and over a large wavelength range, covering at least the C-band
Original languageEnglish
Pages (from-to)740-746
Number of pages7
JournalJournal of Lightwave Technology
Volume25
Issue number3
DOIs
Publication statusPublished - 2007

Fingerprint

Dive into the research topics of 'A single etch-step fabrication-tolerant polarization splitter'. Together they form a unique fingerprint.

Cite this